Paul Holloway is Professor of Materials Science and Engineering at the University of Florida, Gainesville, and the Director of MICROFABRITECH, an interdisciplinary materials research program at the University of Florida.
Prof. Holloway received his Ph.D. in 1972 from the Rensselaer Polytechnic Institute (RPI). He has also worked at General Electric and at Sandia National Laboratories, Albuquerque.
He has received numerous teaching and research awards including being selected for the Alpha Sigma Mu Award of Excellence in 1987, College Teacher of the Year at the University of Florida in 1988, the E.W. Muller Award for Excellence in Surface Science from the University of Wisconsin-Milwaukee, a Professional Excellence Program Award from the University of Florida in 1994, was elected Fellow of the American Vacuum Society in 1993, and made an Honorary Member in 1997. He received the Albert Nerken Award from the American Vacuum Society in 1999. He was elected a Fellow of ASM International in 2000. He holds the Ellis D. Verink Professorship at the University, and was named a Distinguished Professor in 2000.
Prof. Holloway has served as President of the American Vacuum Society and has held numerous other offices in that society. He is active in the Materials Research Society, The Metallurgical Society, the American Society for Metals, the American Chemical Society, The Materials Society (TMS), and the American Society for Testing and Materials.
He is a member of the following honor societies: Phi Kappa Phi, Alpha Sigma Nu, Sigma Pi Sigma, Phi Eta Sigma, Phi Mu Epsilon, and Keramos. He is Editor-in-Chief of Critical Reviews in Solid State and Materials Sciences and serves or has served on the Editorial Boards of Surface Science Spectra, the Journal of Vacuum Science and Technology, and Surface and Interface Analysis. He currently serves on the Editorial Board of Surface Science.
Prof. Holloway has published more than 275 articles and authored four books in his research area. He has given over 60 invited talks and keynote addresses at international meetings including National Symposia of the American Vacuum Society, the Mexican Vacuum Society, the American Chemical Society, the Society for Photo-Optical Instrumentation Engineers, The Metallurgical Society, the Materials Research Society, and the Electrochemical Society.
He is also a regular short course instructor in vacuum science and surface analysis for the American Vacuum Society.
Prof. Holloway is internationally recognized for his work in quantitative surface analysis; grain boundary and thin film diffusion, oxidation, and adhesion in microelectronic devices; thin film processing for microelectromechanical (MEMS) systems; contacts to semiconductors; surface passivation of compound semiconductors; basic science of wide-gap materials for light emitting diodes and lasers; and advanced phosphors for display technologies.
Prof. Holloway is listed in several references including Who's Who in America, Who's Who in Science and Technology, Who's Who in the Southeast, and the International Directory of Distinguished Leadership.
