Scanning Probe Microscopy (SPM) Lab

AFM (Atomic Force Microscope)
This homebuilt Atomic Force Microscope (AFM) has been modified to be used in both ambient and liquid conditions. The piezoelectric scanner, sample holder, and upper plate were modified for liquid environments.  The microscope makes use of a single-tube scanner and a beam deflection technique where light from a laser diode is reflected from the back of a fabricated cantilever onto a four-quadrant photodetector. 

RHK AFM 100/RHK STM 1000 control electronics and software (RHK Technology, Inc., Troy, MI, USA) were equipped as control electronics and used for data collection and data process.  The operation of laser diode and the photo detector is controlled by the RHK AFM 100 electronics and the movement of the piezoelectric scan tube is controlled by RHK STM 1000 electronics.

QCM (Quartz Crystal Microbalance)
Assembled from Maxtek quartz crystal holder, Saunders & Associates Network Analyzer, and software from Prof. Diethelm Johannsmann of TU-Clausthalle, Germany.

image source: www.maxtek.com

Changes in both the resonance frequency and bandwith of the quartz crystal can be monitored by impedance analysis as adsorbates form a thin film on the surface. These yield both mass and dissipation (viscoelastic) information.

Location

	Rhines Hall 129 (352) 8463-324 See directions below